| Abstract |
A series of Yb-doped glass films has been prepared by sol-gel processing within the SiO2-Al2O3-P2O5-Yb2O3 system with doping levels up to 30 mol\% Yb on a cation basis, with a thickness up to similar to 36 mu m. The refractive indices at 633 nm, measured by spectroscopic ellipsometry, varied between 1.457 and 1.577, depending on the composition. Infrared (IR) and Raman spectroscopies were used to establish the main structural features of the different compositions, which included the presence of mixed Si-O-Al bonds evidenced by a IR peak at 940 cm(-1), as well as P=O bonds revealed by a Raman peak at 1326 cm(-1). The photoluminescence spectrum of Yb3+ ions was dominated by peaks at 987 and 1020 nm, with a lifetime between similar to 0.5-1.0 ms. |
